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Spring Contact Test Probes

Our spring contact test probe components are used in a variety of in-circuit testing applications such as printed circuit boards for computers and cell phones. They are also used in the testing of semiconductors and connectors.  Products include socket tubes, probe tubes, barrels, receptacles, and bodies.  Various materials used include nickel silver, phosphorus bronze, plated metals, stainless steel, and clad bi-metal.

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